A quilt exhibit at UW-Madison is meant to celebrate the diverse relationship people have with quilts, and how they've changed ...
Every family is a quilt in progress—an intricate tapestry of personalities, histories, shared memories, and individual ...
Abstract: Defect pattern analysis in wafer bin maps (WBM) plays a significant role in the semiconductor manufacturing process because it helps identify problematic steps or equipment so that process ...
Abstract: In this study, we designed and developed a hexahedral ultraviolet (UV) photodetector using three-dimensional (3D) printing. Furthermore, we demonstrated the proposed photodetector's ...
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